Thursday, February 25, 2016

Free Webinar - Diagnose EMC compliance problems at the PCB level

Live webinar - April 27, 2016: Join our live webinar to diagnose EMC compliance problems at the PCB level at 10:30 AM PT, 1:30 PM ET

Click here for details.

Monday, October 19, 2015

Free Webinar: Very-Near-Field Scanning Solutions for Pinpoint Diagnosis of EMC Compliance Problems

EMSCAN to sponsor this Microwave Journal Webinar on October 28th!

Date and time: Wednesday, October 28, 2015 11:00 am
Eastern Daylight Time (New York, GMT-04:00)
Change time zone
Panelist(s) Info:
Ruska Patton, M.Sc., Director of Product Management, EMSCAN
Duration: 1 hour
Description:
Technical Education Webinar Series









Summary:
EMC chambers are not the best tool to use for debugging when a device fails compliance tests or to diagnose root causes of failures. Systematic problem isolation of components can be effective but it is slow and does not always deliver a resolution. The array-based very near field scanning technique developed by EMSCAN brings real-time evaluation of the spatial distribution of emissions to problem solving. A new method that combines the array of sensors with mechanical motion provides the fastest high resolution scanning available and allows designers to peer inside the IC. Test results from this new system on real world ICs and an application showing how the spatial distribution of emissions can be used to solve problems will be presented.

Sign-up Here!

Tuesday, September 29, 2015

Check out the latest from Finisar's Instrumentation Group!

Follow this link to download Finisar's Autumn Newletter. 

Featuring:
  • WaveAnalyzer™: Upgraded performance and additional Signal Analysis software
  • WaveShaper™ 1000/SP: Now sampling for 1μm fibre lasers
  • WaveShaper™ 16000: Upgraded Fourier Processor capability
  • WaveManager: New version available
  • Ultraspan High-Performance Fibre Amplifiers: Now shipping
  • WaveAnalyzer App: Preview of forthcoming WaveAnalyzer App for Android

Wednesday, July 15, 2015

eagleyard Photonics, a leading supplier of high-power laser diodes, expands its single frequency product family!

After the successful introduction of the new butterfly with window housing for the DBR 633 nm laser diode, eagleyard now offers this additional housing option for the single frequency product family.

The 780nm and 852nm DFB laser continue the advancement. The hermetically sealed standard butterfly housing provides a collimated beam with a circular profile.

The GaAs -based DFB-852 laser diode with its new 14-pin butterfly package with window consists of an integrated thermistor, thermo-electric cooler (TEC) and a monitor diode. The device is capable of providing 100 mW @ 852 nm with a spectral linewidth of 2 MHz and below. The small footprint of this laser diode is perfectly suited for demanding size requirements. Its integrated beam collimation and circular beam profile makes this laser diode very attractive for metrology applications. The same refers to the DFB-780 laser diode just that it provides up to 80 mW @ 780 nm.

“The compact design in conjunction with the narrow linewidth performance of the DFB’s, opens new opportunities for our customers as these laser diodes can conveniently be integrated in any system” says Michael Kneier, VP Sales and Marketing at eagleyard. “This is especially true for interferometry or Rb and Cs spectroscopy – just straightforward” finishes Kneier.

XSoptix, LLC is the Authorized North American Distributor for eagleyard lasers. Visit the website here to download the datasheets!

Thursday, April 9, 2015

Latest Product News and Updates from Pickering Interfaces

New Diagnostic and Switching Products from Pickering Interfaces

Our mission is to provide our customers the broadest selection, the highest density and lowest cost for advanced functional test applications. Click here for the link to Pickering's latest product information.....

Friday, February 20, 2015

Introspect making an impact at DesignCon

Introspect won the Best in Test Award for Signal Integrity/High-Speed Test at DesignCon 2015! See the article here.

Introspect was also one of 8 vendors interviewed at the show regarding their product offering and approach to High Speed Test. This article provides a very good overview of the landscape from which design and signal integrity engineers can find solutions to the ever increasing challenges that multi-gigabit digital interfaces present. See the article here.